The focus of the webinar is on X-ray tomography, which is a widely recognized technique for visualizing and analyzing the internal three-dimensional structure of objects. Originally developed for medical applications, its use has rapidly expanded across both research and industry. Though straightforward to implement, CT devices vary greatly, ranging from portable systems to large-scale research facilities like synchrotrons. To identify the most suitable instrument for specific research needs, it is beneficial to define the required resolution, which refers to the ability to visualize details of a certain size (spatial resolution), distinguish regions that are very similar to each other (contrast resolution) as well as monitor something that is happening (temporal resolution).
The webinar will provide examples to help clarify the various concepts.
Dr. Diego Dreossi is a physicist specializing in instrumentation and X-ray imaging techniques. He began his career working on various experiments at large-scale accelerators, including CERN (Geneva) and Fermilab (Batavia, Illinois), as an associate member of INFN (National Institute for Nuclear Physics, Italy), where he developed new position-sensitive detectors. After a SIEMENS fellowship focused on CT imaging optimization, he spent two years at the University of Trieste implementing new X-ray imaging techniques for cartilage and bone studies. From 2000 to 2006, he was a research assistant at the University of Trieste, coordinating synchrotron X-ray mammography trials at Elettra-Sincrotrone Trieste. During this time, he also worked as a software consultant and co-invented a patent with Prof. Cosmi. In 2006, he became a Scientist and Technical Manager at Elettra’s X-ray imaging beamline, advancing research in biomedical and material science, and contributing to the development of X-ray microCT laboratories in Italy and abroad.